Authors Gwang-Sik Kim, Gwangwe Yoo, Yu Jin Seo, Seung-Hwan Kim, Byung Jin Cho, Changhwan Shin, Jin-Hong Park, and Hyun-Yong Yu 
Journal/Conference IEEE Electron Device Lett. 
Date Jun. 2016. 
volume vol. 37 
Number no. 6 
Page pp. 709-712 

Gwang-Sik Kim, Gwangwe Yoo, Yu Jin Seo, Seung-Hwan Kim, Byung Jin Cho, Changhwan Shin, Jin-Hong Park, and Hyun-Yong Yu, "Effect of Hydrogen Annealing on Contact Resistance Reduction of Metal–Interlayer–n-Germanium Source/Drain Structure", IEEE Electron Device Letters, vol. 37, no. 6, pp. 709-712, Jun. 2016.