Authors Yujin Seo, Tae In Lee, Chang Mo Yoon, Bo Eun Park, Wan Sik Hwang, Hyungjun Kim, Hyun-Yong Yu and Byung Jin Cho 
Journal/Conference IEEE Transactions on Electron Devices 
Date May. 2017. 
volume vol. 64 
Number no. 8 
Page pp. 3303-3307 

Yujin Seo, Tae In Lee, Chang Mo Yoon, Bo Eun Park, Wan Sik Hwang, Hyungjun Kim, Hyun-Yong Yu and Byung Jin Cho, "The Impact of an Ultrathin Y2O3 layer on GeO2 Passivation in Ge MOS Gate Stacks", IEEE Transactions on Electron Devices, Vol. 64, No.8, pp. 3303-3307, May. 2017