Authors Jae Hoon Bong, Seung-Yoon Kim, Chan Bae Jeong, Ki Soo Chang, Wan Sik Hwang and Byung Jin Cho 
Journal/Conference Applied Physics Letters 
Date Jun. 2017. 
volume vol. 110 
Page pp. 252101 

Jae Hoon Bong, Seung-Yoon Kim, Chan Bae Jeong, Ki Soo Chang, Wan Sik Hwang and Byung Jin Cho, "Reliability Improvement of a Flexible FD-SOI MOSFET via Heat Management", Applied Physics Letters, June. 2017. 110, 252101