Inventor S. H. Park, C. Y. Yoo, H. S. Kim, M. S. Seo, D. K. Kim, B. J. Cho 
Country Korea Patent 
Number 10-2016-0172455 
Date 2016 

HIGH TEMPERATURE STRUCTURE FOR MEASURING OF PROPERTIES OF CURVED THERMOELECTRIC DEVICE, SYSTEM FOR MEASURING OF PROPERTIES OF CURVED THERMOELECTRIC DEVICE USING THE SAME AND METHOD THEREOF (Patent pending)