Authors Yujin Seo, Choog Ki Kim, Tae In Lee, Wan Sik Hwang, Hyun-Yong Yu, Yang Kyu Choi and Byung Jin Cho 
Journal/Conference IEEE Transactions on Electron Devices 
Date Oct. 2017. 
volume vol. 64 
Number no. 10 
Page pp. 3998-4001 

Yujin Seo, Choog Ki Kim, Tae In Lee, Wan Sik Hwang, Hyun-Yong Yu, Yang Kyu Choi and Byung Jin Cho, "Investigation of border trap characteristics in the AlON/GeO2/Ge gate stacks", IEEE Transactions on Electron Devices,  Vol. 64, No. 10, 3998-4001, October,. 2017