Inventor S. H. Park, C. Y. Yoo, H. S. Kim, M. S. Seo, D. K. Kim, B. J. Cho 
Country US Patent 
Number 15/217,429 
Date 2016 

HIGH TEMPERATURE STRUCTURE FOR MEASURING OF PROPERTIES OF CURVED THERMOELECTRIC DEVICE, SYSTEM FOR MEASURING OF PROPERTIES OF CURVED THERMOELECTRIC DEVICE USING THE SAME AND METHOD THEREOF (Patent pending)