Authors Seung-Yoon Kim, Jae Hoon Bong, Dong Jun Kim, Choong Sun Kim, Hyeongdo Choi, Wan Sik Hwang, Byung Jin Cho 
Journal/Conference IEEE Transactions of Electron Devices 
Date Jul. 2018. 
volume vol. 65 
Number no. 7 
Page pp. 3069-3072 

Performance Degradation of Flexible Si Nanomembrane Transistors With Al2O3and SiO2Dielectrics Under Mechanical Stress