Authors B. J. Cho, Z. Xu, H. Guan, and M. F. Li 
Journal/Conference J. Appl. Phys. 
Date Dec. 1999. 
volume vol. 86 
Number no. 11 
Page pp. 6590-6592 

B. J. Cho, Z. Xu, H. Guan, and M. F. Li, "Effect of substrate hot-carrier injection on quasi-breakdown of ultra-thin gate oxide", J. Appl. Phys., vol. 86, no. 11, pp. 6590-6592, Dec. 1999.