Authors C. H. Ang, C. H. Ling, Z. Y. Cheng, S. J. Kim, and B. J. Cho 
Journal/Conference Jpn. J. Appl. Phys. 
Date Jul. 2000. 
volume vol. 39 
Number no. 7B 
Page pp. L757-L759 

C. H. Ang, C. H. Ling, Z. Y. Cheng, S. J. Kim, and B. J. Cho, "Reduction of radiation-induced leakage currents in thin oxides by application of a low post-irradiation gate bias", Jpn. J. Appl. Phys., vol. 39, no. 7B, pp. L757-L759, Jul. 2000.