Authors C. H. Ang, C. H. Ling, Z. Y. Cheng, and B. J. Cho 
Journal/Conference J. Appl. Phys. 
Date Sep. 2000. 
volume vol. 88 
Number no. 5 
Page pp. 2872-2876 

C. H. Ang, C. H. Ling, Z. Y. Cheng, and B. J. Cho, "Origin of temperature-sensitive hole current at low gate voltage regime in ultrathin gate oxide", J. Appl. Phys., vol. 88, no. 5, pp. 2872-2876, Sep. 2000.