Authors C. H. Ang, C. H. Ling, Z. Y. Cheng, S. J. Kim, and B. J. Cho 
Journal/Conference Semicond. Sci. Technol. 
Date Oct. 2000. 
volume vol. 15 
Number no. 10 
Page pp. 961-964 

C. H. Ang, C. H. Ling, Z. Y. Cheng, S. J. Kim, and B. J. Cho, "A comparative study of radiation-induced and stress-induced leakage currents in thin gate oxides", Semicond. Sci. Technol., vol. 15, no. 10, pp. 961-964, Oct. 2000.