Authors C. H. Ang, C. H. Ling, B. J. Cho, S. J. Kim, and Z. Y. Cheng 
Journal/Conference Solid-State Electron. 
Date Nov. 2000. 
volume vol. 44 
Number no. 11 
Page pp. 2001-2007 

C. H. Ang, C. H. Ling, B. J. Cho, S. J. Kim, and Z. Y. Cheng, "Radiation and electrical stress-induced hole trap-assisted tunneling currents in ultrathin gate oxides", Solid-State Electron., vol. 44, no. 11, pp. 2001-2007, Nov. 2000.