Authors C. H. Ang, C. H. Ling, Z. Y. Cheng, S. J. Kim, and B. J. Cho 
Journal/Conference IEEE Trans. Nucl. Sci. 
Date Dec. 2000. 
volume vol. 47 
Number no. 6 
Page pp. 2758-2764 

C. H. Ang, C. H. Ling, Z. Y. Cheng, S. J. Kim, and B. J. Cho, "Bias and thermal annealings of radiation-induced leakage currents in thin gate oxides", IEEE Trans. Nucl. Sci., vol. 47, no. 6, pp. 2758-2764, Dec. 2000.