Authors C. H. Ang, S. S. Tan, C. M. Lek, W. Lin, Z. J. Zheng, T. Chen, and B. J. Cho 
Journal/Conference Electrochem. Solid-State Lett. 
Date Apr. 2002. 
volume vol. 5 
Number no. 4 
Page pp. G26-G28 

C. H. Ang, S. S. Tan, C. M. Lek, W. Lin, Z. J. Zheng, T. Chen, and B. J. Cho, "Suppression of nitridation-induced interface traps and hole mobility degradation by nitrogen plasma nitridation", Electrochem. Solid-State Lett., vol. 5, no. 4, pp. G26-G28, 2002.