Authors W. Y. Loh, B. J. Cho, and M. F. Li 
Journal/Conference J. Appl. Phys. 
Date Apr. 2002. 
volume vol. 91 
Number no. 8 
Page pp. 5302-5306 

W. Y. Loh, B. J. Cho, and M. F. Li, "Evolution of quasi-breakdown mechanism in thin gate oxides", J. Appl. Phys., vol. 91, no. 8, pp. 5302-5306, Apr. 2002.