Authors W. Y. Loh, B. J. Cho, and M. F. Li 
Journal/Conference Appl. Phys. Lett. 
Date Jul. 2002. 
volume vol. 81 
Number no. 2 
Page pp. 379-381 

W. Y. Loh, B. J. Cho, and M. F. Li, "Correlation between direct tunneling leakage current degradation and interface traps in ultrathin silicon dioxides", Appl. Phys. Lett., vol. 81, no. 2, pp. 379-381, Jul. 2002.