Authors Y. P. Zeng, Y. F. Lu, Z. X. Zhen, W. X. Sun, T. Yu, L. Liu, J. N. Zeng, B. J. Cho, and C. H. Poon 
Journal/Conference Nanotechnol. 
Date May. 2004. 
volume vol. 15 
Number no. 5 
Page pp. 658-662 

Y. P. Zeng, Y. F. Lu, Z. X. Zhen, W. X. Sun, T. Yu, L. Liu, J. N. Zeng, B. J. Cho, and C. H. Poon, "Raman spectroscopy investigation on excimer laser annealing and thickness determination of nanoscale amorphous silicon," Nanotechnol., vol. 15, no. 5, pp. 658-662, May. 2004.