Authors S. Mathew, L. K. Bera, N. Balasubramanian, M. S. Joo, and B. J. Cho 
Journal/Conference Thin Solid Films 
Date Sep. 2004. 
volume vol. 462-463 
Page pp. 11-14 

S. Mathew, L. K. Bera, N. Balasubramanian, M. S. Joo, and B. J. Cho, "Channel mobility degradation and charge trapping in high-K/metal gate NMOSFETs," Thin Solid Films, vol. 462-463, pp. 11-14, Sep. 2004.