Authors Y. N. Tan, W. K. Chim, B. J. Cho, and W. K. Choi 
Journal/Conference IEEE Trans. Electron Devices 
Date Jul. 2004. 
volume vol. 51 
Number no. 7 
Page pp. 1143-1147 

Y. N. Tan, W. K. Chim, B. J. Cho, and W. K. Choi, "Over-erase phenomenon in SONOS-type Flash memory and its minimization using a hafnium oxide charge storage layer," IEEE Trans. Electron Devices, vol. 51, no. 7, pp. 1143-1147, Jul. 2004.