Authors M. S. Joo, B. J. Cho, N. Balasubramanian, and D. L. Kwong 
Journal/Conference IEEE Electron Device Lett. 
Date Nov. 2004. 
volume vol. 25 
Number no. 11 
Page pp. 716-718 

M. S. Joo, B. J. Cho, N. Balasubramanian, and D. L. Kwong, "Thermal instability of effective work function in metal/high-K stack and its material dependence," IEEE Electron Device Lett., vol. 25, no. 11, pp. 716-718, Nov. 2004.