Authors C. H. Poon, L. S. Tan, B. J. Cho, and A. Y. Du 
Journal/Conference J. Electrochem. Soc. 
Date Dec. 2005. 
volume vol. 152 
Number no. 12 
Page pp. G895-G899 

C. H. Poon, L. S. Tan, B. J. Cho, and A. Y. Du, "Dopant loss mechanism in n+/p germanium junctions during rapid thermal annealing," J. Electrochem. Soc., vol. 152, no. 12, pp. G895-G899, Dec. 2005.