Authors C. C. Yeo, B. J. Cho, M. H. Lee, C. W. Liu, K. J. Choi and T. W. Lee 
Journal/Conference Semiconductor sci. and technol 
Date May. 2006. 
volume vol. 21 
Page pp. 665-669 

C. C. Yeo, B. J. Cho, M. H. Lee, C. W. Liu, K. J. Choi and T. W. Lee, "Thermal stability study of Si cap/ultrathin Ge/Si and strained Si/Si1-xGex/Si nMOSFETs with HfO2 gate dielectric," Semiconductor sci. and technol., vol. 21, pp. 665-669, May. 2006.