Authors D. Maji, S. P. Duttagupta, V. R. Rao, C. C. Yeo, and B. J. Cho 
Journal/Conference IEEE Electron Device Lett. 
Date Aug. 2007. 
volume vol. 28 
Number no. 8 
Page pp. 731-711 

D.Maji, S.P.Duttagupta, V.R.Rao, C.C.Yeo, and B.J.Cho, "Border-Trap CharacteNrization in High-K Strained-Si MOSFETs," IEEE Electron Device Lett., vol. 28, no.8, pp. 731-711, Aug. 2007.