Authors G.K.Dalapati, Y.Tong, W.Y.Loh, H.K.Mun, and B.J.Cho 
Journal/Conference IEEE Trans. on Electron. Devices 
Date Aug. 2007. 
volume vol. 54 
Number no. 8 
Page pp. 1831-1837 

G.K.Dalapati, Y.Tong, W.Y.Loh, H.K.Mun, and B.J.Cho, "Electrical and Interfacial Characterization of Atomic Layer Deposited High-K Gate Dielectrics on GaAs for Advanced CMOS Devices", IEEE Trans. on Electron. Devices, vol. 54, no. 8, pp. 1831-1837, Aug. 2007.